Bit error in NAND Flash (SD-Card)


I have to evaluate the probability of bit errors in a SD Card. Im using a Data Logger with SD Slot to catch bit errors and log to internal EEPROM and want to keep the Arduino on for ca. 2 weeks.
I want to do 2 test runs. My first run should be in an trouble-free environment and see if bit-flips will occur. Understanding the NAND Flash technology, the most common cause for a bit-flip is due to de-trapping of electrons, meaning that the state of 1 switches to 0.
I have 3 questions:

  1. Is there a probabilty chance for a bit-flip in NAND flash which you can calculate? I just found statistic calculations for DRAM or EEPROM. I guess you cant applicate those to NAND flash.
  2. Is it possible that a cell switches from 0 to 1? If yes, how does this work? I mean the electrons cant move to a neighbour cell, right?
  3. For my second test run: Is there any way to provocate bit-flips in NAND Flash besides temperature or radiation?