Hackscribble:
Hello panther3001I think I've got a sense of the statistical process in the Atmel paper. Having just built a device with added outboard ADCs, I'll be a bit miffed if it turns out I could have done it in software
There are also limitations set out in that paper and your posts: the need for random noise, the extended sample period, the assumption that the signal under test does not vary during the sample period.
So I guess the proof of whether this is a practical technique will come through testing.
Personally, I'm willing to invest in an ADC and time to do some testing. I think it's important to define the test method and expected results in advance.
Maybe you could suggest what the testing should involve, and others can comment. I'll probably start with the MCP4725, since I've used it recently.
All the best
Ray
Absolutely! Suggestions coming up soon.