At hackaday they describe how someone purposely nuked an EEProm. This time for an Arduino. The last time someone did this for external EEProms. Hackaday as well as both experimenters fail to understand that the collected data is useless. After 1,230,163 cycles one EEProm cell failed to retain data for a short period of time. However the actual failure was most probably much earlier. The reason is that EEProm failure is characterized by decreased retention time. So what they found is that after 10 times the specified value of write accesses the retention time is way below the specified retention time. Thus the failure to meet the specification was obviously much earlier.
Of course the experiment did not even consider influences like voltage, temperature or production deviations.
Why is it that such clueless measurements get so much attention?